Debug Interfaces

The CC23xx and CC27xx platform supports serial wire debug (SWD) debug interface. SWD is an ARM bi-directional 2-wire protocol that communicates with the JTAG test access port controller, and allows for complete debug functionality. The SWD debug is inherently compatible with Texas Instruments’ XDS family of debug probes.

The hardware resources included on the devices for debugging are listed as follows. Not all debugging functionality is available in all combinations of debug probe and IDE.

• Data Watchpoint and Trace Unit (DWT) - 2 watchpoints on memory access.

• Breakpoint unit (BPU) - 4 breakpoint registers.

XDS110 Debug Probe

Some CC23xx and CC27xx platforms, like the LP-EM-CC2340R5 have a split-LaunchPad design, which is includes a detachable XDS110 debug board. The CC23xx LaunchPad supports a 20-pin LP-EM debug connector, and this is the assumed debug probe for most development.

The XDS110 is the latest entry level debug probe (emulators) for TI embedded processors. Designed to be a complete solution that delivers JTAG and SWD connectivity at a low cost, the XDS110 is the debug probe of choice for entry-level debugging of TI microcontrollers, processors and SimpleLink devices. Also, both Core Processor and System Trace are available for all Arm and DSP devices that support Embedded Trace Buffer (ETB).

It is possible to buy the XDS110 as a standalone debugger. For example: XDS110ET LaunchPad