AM263Px MCU+ SDK: Diag_Mon_ExcFreq_Degradataion_data Struct Reference

| AM263Px MCU+ SDK 26.00.00 |

Data Fields
Diag_Mon_ExcFreq_Degradataion_data Struct Reference
APIs for SOC Specific Device Drivers » APIs for RESOLVER

## Detailed Description

Structure to hold the control/status data for Diagnostics mentioned under Monitor excitation frequency degradation or loss (DOS)

Values that can be passed to RDC_getDiagnosticsExcFreqDegradationData(), RDC_setDiagnosticsExcFreqDegradationData() as Diag_Mon_ExcFreq_Degradataion_data parameter

## Data Fields
uint16_t | excfreqdetected_sin
uint16_t | excfreqdetected_cos
uint16_t | excfreqdrift_threshold_hi
uint16_t | excfreqdrift_threshold_lo
uint16_t | excfreq_level
uint8_t | excfreqdrift_glitchcount
bool | excfreqdrift_hi
bool | excfreqdrift_cos_lo
bool | excfreqdrift_sin_lo
bool | excfreqdrift_en

## Field Documentation

## ◆ excfreqdetected_sin

uint16_t Diag_Mon_ExcFreq_Degradataion_data::excfreqdetected_sin

## ◆ excfreqdetected_cos

uint16_t Diag_Mon_ExcFreq_Degradataion_data::excfreqdetected_cos

## ◆ excfreqdrift_threshold_hi

uint16_t Diag_Mon_ExcFreq_Degradataion_data::excfreqdrift_threshold_hi

## ◆ excfreqdrift_threshold_lo

uint16_t Diag_Mon_ExcFreq_Degradataion_data::excfreqdrift_threshold_lo

## ◆ excfreq_level

uint16_t Diag_Mon_ExcFreq_Degradataion_data::excfreq_level

## ◆ excfreqdrift_glitchcount

uint8_t Diag_Mon_ExcFreq_Degradataion_data::excfreqdrift_glitchcount

## ◆ excfreqdrift_hi

bool Diag_Mon_ExcFreq_Degradataion_data::excfreqdrift_hi

## ◆ excfreqdrift_cos_lo

bool Diag_Mon_ExcFreq_Degradataion_data::excfreqdrift_cos_lo

## ◆ excfreqdrift_sin_lo

bool Diag_Mon_ExcFreq_Degradataion_data::excfreqdrift_sin_lo

## ◆ excfreqdrift_en

bool Diag_Mon_ExcFreq_Degradataion_data::excfreqdrift_en